Application of calendar-based temporal classification to forecast customer load patterns from load demand data. - Heon Gyu Lee; Bum Ju Lee; Jin-Ho Shin; Long Jin 005; Cheng Hao Jin; Keun Ho Ryu (CIT, 2008)

Correlation of Amino Acid Physicochemical Properties with Protein Secondary Structure Conformation. - Gouchol Pok; Cheng Hao Jin; Keun Ho Ryu (BMEI (1), 2008)

Design of Context Analysis System on USN Environment. - Cheng Hao Jin; Yongmi Lee; Gyoyong Sohn; Hi-Seok Kim; Keun Ho Ryu (ITNG, 2009)

Classification of Closed Frequent Patterns Improved by Feature Space Transformation. - Cheng Hao Jin; Gouchol Pok; Hi-Seok Kim; Eun Jong Cha; Keun Ho Ryu (CIT, 2010)

Prediction of wind power generation and power ramp rate with time series analysis. - Mi Yeong Hwang; Cheng Hao Jin; Yang Koo Lee; Kwang Deuk Kim; Jung-Hoon Shin; Keun Ho Ryu (iCAST, 2011)

Forecasting wind power generation patterns based on SOM clustering. - Kyu Ik Kim; Cheng Hao Jin; Yang Koo Lee; Kwang Deuk Kim; Keun Ho Ryu (iCAST, 2011)

A New Approach for Calculating Similarity of Categorical Data. - Cheng Hao Jin; Xun Li; Yang Koo Lee; Gouchol Pok; Keun Ho Ryu (ICHIT (2), 2011)

Detection of Correlated Microarray Expressions Using Difference Values. - Gouchol Pok; Cheng Hao Jin; Oyun-Erdene Namsrai; Keun Ho Ryu (ICHIT (2), 2012)

Ensemble method for classification of high-dimensional data. - Yongjun Piao; Hyun Woo Park; Cheng Hao Jin; Keun Ho Ryu (BigComp, 2014)

Wafer map defect pattern classification based on convolutional neural network features and error-correcting output codes. - Cheng Hao Jin; Hyun-Jin Kim; Yongjun Piao; Meijing Li; Minghao Piao (J. Intell. Manuf., 2020)

Personalized Federated Learning for Multi-task Fault Diagnosis of Rotating Machinery. - Sheng Guo; Zengxiang Li; Hui Liu; Shubao Zhao; Cheng Hao Jin (CoRR, 2022)

CNN and ensemble learning based wafer map failure pattern recognition based on local property based features. - Minghao Piao; Cheng Hao Jin (J. Intell. Manuf., 2023)

Antecedent hash modality learning and representation for enhanced wafer map defect pattern recognition. - Minghao Piao; Cheng Hao Jin; Baojiang Zhong (Expert Syst. Appl., 2024)

Image Hash Layer Triggered CNN Framework for Wafer Map Failure Pattern Retrieval and Classification. - Minghao Piao; Yi Sheng; Jinda Yan; Cheng Hao Jin (ACM Trans. Knowl. Discov. Data, 2024)

Heterogeneous Federated Learning Framework for IIoT Based on Selective Knowledge Distillation. - Sheng Guo 004; Hui Chen; Yang Liu 165; Chengyi Yang; Zengxiang Li; Cheng Hao Jin (IEEE Trans. Ind. Informatics, 2025)