Using a single input to support multiple scan chains. - Kuen-Jong Lee; Jih-Jeen Chen; Cheng-Hua Huang (ICCAD, 1998)

Broadcasting test patterns to multiple circuits. - Kuen-Jong Lee; Jih-Jeen Chen; Cheng-Hua Huang (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1999)