Energy Saving Based on CPU Voltage Scaling and Hardware Software Partitioning. - Chia Hsiang Hsu; Cheng-Juei Yu; Sheng-De Wang (PRDC, 2007)

Heuristic algorithm for the resource constrained scheduling problem during high-level synthesis. - Yi-Hsin Wu; Cheng-Juei Yu; Sheng-De Wang (IET Comput. Digit. Tech., 2009)

An in-place search algorithm for the resource constrained scheduling problem during high-level synthesis. - Cheng-Juei Yu; Yi-Hsin Wu; Sheng-De Wang (ACM Trans. Design Autom. Electr. Syst., 2010)

Fault detection of surveillance camera using fixed-point arithmetic operations. - Yi-Chong Zeng; Cheng-Juei Yu; Wen-Tsung Chang (ICCE-TW, 2014)

Multi-objective Value-Driven Smart Building Management Solutions. - Chien Lin; Jiunhau Ye; Cheng-Juei Yu; Ming-Lung Weng; Juiwen Chang; Tsung-Lin Wu; Morris H. Hsiao; Grace Lin (CCBD, 2015)

Streaming analytics processing in manufacturing performance monitoring and prediction. - Yi-Hsin Wu; Sheng-De Wang; Li-Jung Chen; Cheng-Juei Yu (IEEE BigData, 2017)

Dynamic dispatching for re-entrant production lines - A deep learning approach. - Fang-Yi Zhou; Cheng-Hung Wu; Cheng-Juei Yu (CASE, 2017)

An Approach to the Design of Specific Hardware Circuits from C Programs. - Cheng-Juei Yu; Yi-Hsin Wu; Sheng-De Wang (J. Inf. Sci. Eng., 2018)

Using Partial Combination Models to Improve Prediction Quality and Transparency in Mixed Datasets. - Yi-Hsin Wu; Yu-Hsin Chang; Yin-Jing Tien; Cheng-Juei Yu; Sheng-De Wang; Cheng-Hung Wu (IEEE Access, 2020)

Dynamic dispatching and preventive maintenance for parallel machines with dispatching-dependent deterioration. - Cheng-Hung Wu; Yi-Chun Yao; Stéphane Dauzère-Pérès; Cheng-Juei Yu (Comput. Oper. Res., 2020)

A deep learning approach for the dynamic dispatching of unreliable machines in re-entrant production systems. - Cheng-Hung Wu; Fang-Yi Zhou; Chi-Kang Tsai; Cheng-Juei Yu; Stéphane Dauzère-Pérès (Int. J. Prod. Res., 2020)

A dataset from semiconductor assembly and testing processes. - Cheng-Juei Yu (IEEE DataPort, 2020)

Detecting and Scoring Equipment Faults in Real Time During Semiconductor Test Processes. - Yi-Hsin Wu; Jui-Yu Huang; Yi-Chun Yao; Yin-Jing Tien; Cheng-Juei Yu; Sheng-De Wang (IEEE Des. Test, 2021)