High temperature induced failure in Ti/Al/Ni/Au Ohmic contacts on AlGaN/GaN heterostructure. - Zhihua Dong; Jinyan Wang; Cheng P. Wen; Shenghou Liu; Rumin Gong; Min Yu; Yilong Hao; Fujun Xu; Bo Shen; Yangyuan Wang (Microelectron. Reliab., 2012)

High-Performance Quasi-Vertical GaN Schottky Barrier Diode on Silicon Substrate with a Low Dislocation Density Drift Layer. - Yue Li; Ruiyuan Yin; Ming Tao 001; Yilong Hao; Cheng P. Wen; Maojun Wang; Jie Zhang 055; Xuelin Yang; Bo Shen (ICICDT, 2019)

Toward Reliable Extraction of the Properties of Border Traps in Lateral GaN Power MOSFET with a Distributed Network Model. - Ruiyuan Yin; Yue Li; Wei Lin 004; Cheng P. Wen; Yilong Hao; Yunyi Fu; Maojun Wang (ICICDT, 2019)