A Pulsed Electrochemistry Readout IC with Slew-rate Booting Technique and Phase-domain ΔΣ ADC for Si-Nanowire Electrical Double-layer Capacitance Measurement. - Po-Hsun Chu; Cheng-Tse Tsai; Yu-Siang Chou; Nitish Kumar; Shu-Ping Lin; Yu-Te Liao (VLSI Technology and Circuits, 2024)