Structure optimization of field-plate AlGaN/GaN HEMTs. - Weijun Luo; Ke Wei; Xiaojuan Chen; Chengzhan Li; Xinyu Liu; Xiaoliang Wang (Microelectron. J., 2007)

Effects of combined NO and forming gas annealing on interfacial properties and oxide reliability of 4H-SiC MOS structures. - Zhaoyang Peng; Yiyu Wang; Huajun Shen; Chengzhan Li; Jia Wu; Yun Bai; Kean Liu; Xinyu Liu (Microelectron. Reliab., 2016)