TLP evaluation of ESD protection capability of graphene micro-ribbons for ICs. - Wei Zhang 117; Qi Chen 008; Ming Xia; Rui Ma 003; Fei Lu 004; Chenkun Wang; Albert Z. Wang; Ya-Hong Xie (ASICON, 2015)

A Systematic Study of ESD Protection Co-Design With High-Speed and High-Frequency ICs in 28 nm CMOS. - Fei Lu 004; Rui Ma 003; Zongyu Dong; Li Wang 058; Chen Zhang 017; Chenkun Wang; Qi Chen 008; X. Shawn Wang; Feilong Zhang 001; Cheng Li; He Tang; Yuhua Cheng; et al. (IEEE Trans. Circuits Syst. I Regul. Pap., 2016)

Characterization of single-crystalline graphene ESD interconnects. - Qi Chen 008; Cheng Li; Fei Lu 004; Chenkun Wang; Feilong Zhang 001; Tianru Wu; Xiaoming Xie; Kun Zhang; Xinxin Li; Jimmy Ng; Ya-Hong Xie; Yuhua Cheng; et al. (ASICON, 2017)

Key note: Integrated design-for-reliability for ICs. - Albert Z. Wang; Fei Lu 004; Qi Chen 008; Chenkun Wang; Cheng Li; Feilong Zhang 001 (LASCAS, 2017)

TLP measurement and analysis of graphene NEMS switches for on-chip ESD protection. - Qi Chen 008; Cheng Li; Fei Lu 004; Chenkun Wang; Feilong Zhang 001; Albert Z. Wang; Jimmy Ng; Ya-Hong Xie (NEMS, 2017)

More-Than-Moore: 3D heterogeneous integration into CMOS technologies. - Albert Z. Wang; Qi Chen 008; Cheng Li; Fei Lu 004; Chenkun Wang; Feilong Zhang 001; X. Shawn Wang; Jimmy Ng; Ya-Hong Xie; Rui Ma 003; Li Wang 058; Lin Lin 011 (NEMS, 2017)

3D heterogeneous integration enabling future RF ICs. - Qi Chen 008; Chenkun Wang; Feilong Zhang 001; Cheng Li; Albert Z. Wang (RWS, 2018)

A study of impacts of ESD protection on 28/38GHz RF switches in 45nm SOI CMOS for 5G mobile applications. - Chenkun Wang; Fei Lu 004; Qi Chen 008; Feilong Zhang 001; Cheng Li; Dawn Wang; Albert Z. Wang (RWS, 2018)

A Full-Chip ESD Protection Circuit Simulation and Fast Dynamic Checking Method Using SPICE and ESD Behavior Models. - Feilong Zhang 001; Chenkun Wang; Fei Lu 004; Qi Chen 008; Cheng Li; X. Shawn Wang; Daguang Li; Albert Z. Wang (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2019)

A Study of Transient Voltage Peaking in Diode-Based ESD Protection Structures in 28nm CMOS. - Chenkun Wang; Feilong Zhang 001; Fei Lu 004; Qi Chen 008; Cheng Li; Albert Z. Wang (IEEE Access, 2020)

A 112.5Gb/s ADC-DSP-Based PAM-4 Long-Reach Transceiver with >50dB Channel Loss in 5nm FinFET. - Zhendong Guo; Ahmed Mostafa; A. Elshazly; Bo Chen; B. Wang; C. Han; Chenkun Wang; D. Zhou; Davide Visani; Edmund Hsiao; F. Chu; Fei Lu; et al. (ISSCC, 2022)