Defect Sample Image Generation Method Based on GANs in Diamond Tool Defect Detection. - Chenyang Zhao 001; Wen Xue; Wenpeng Fu; Zhang-Qing Li; Xinming Fang (IEEE Trans. Instrum. Meas., 2023)

An Investigation of the Influence of Light Intensity on Microscopic Imaging in Nanoscale Positioning Measurement. - Xinming Fang; Zijian Zhu; Chenyang Zhao 001 (IEEE Trans. Instrum. Meas., 2024)

Micro-Vision Super-Resolution Restoration and Positioning Based on Ultraprecision Machining Topography Guidance. - Zijian Zhu; Chenyang Zhao 001; Yueping Xi (IEEE Trans. Instrum. Meas., 2024)

Calibration for Industrial Optical High-Resolution Microimaging Systems. - Zijian Zhu; Chenyang Zhao 001; Xinming Fang (IEEE Trans. Ind. Electron., 2024)

An Investigation of the Planar 3-DOF Nanoscale Positioning Measurement Method Based on Cross-Encoded Pattern. - Weien Yu; Zijian Zhu; Chenyang Zhao 001; Yueping Xi; Yang Yang; Qiaozhi Lei (IEEE Trans. Instrum. Meas., 2025)

Microscale 3-D Rotation Estimation Based on Deflected Defocused Feature Extraction. - Zijian Zhu; Qinghong Wan; Yingxue Yao; Yueping Xi; Chenyang Zhao 001 (IEEE Trans. Instrum. Meas., 2025)

Galaxy Microstructure: An Absolute Encoding Method for Planar 3-DOF Nanoscale Positioning Measurement. - Zijian Zhu; Chenyang Zhao 001 (IEEE Trans. Instrum. Meas., 2025)

Influence Mechanism of the Surface Topography on the Positioning Measurement Accuracy of Micro-Vision Pattern Targets. - Zijian Zhu; Chenyang Zhao 001; Yang Yang; Yueping Xi (IEEE Trans. Instrum. Meas., 2025)