SRAM stability design comprehending 14nm FinFET reliability. - Choelhwyi Bae; Sangwoo Pae; Cheong-sik Yu; Kangjung Kim; Yongshik Kim; Jongwoo Park 001 (IRPS, 2015)

Radiation-induced soft error rate analyses for 14 nm FinFET SRAM devices. - Soonyoung Lee; Ilgon Kim; Sungmock Ha; Cheong-sik Yu; Jinhyun Noh; Sangwoo Pae; Jongwoo Park 001 (IRPS, 2015)