Cache RAM inductive fault analysis with fab defect modeling. - T. M. Mak; Debika Bhattacharya; Cheryl Prunty; Bob Roeder; Nermine Ramadan; F. Joel Ferguson; Jianlin Yu (ITC, 1998)

High volume microprocessor test escapes, an analysis of defects our tests are missing. - Wayne M. Needham; Cheryl Prunty; Yeoh Eng Hong (ITC, 1998)

Experimental Evaluation of Bridge Patterns for a High Performance Microprocessor. - Sreejit Chakravarty; Yi-Shing Chang; Hiep Hoang; Sridhar Jayaraman; Silvio Picano; Cheryl Prunty; Eric W. Savage; Rehan Sheikh; Eric N. Tran; Khen Wee (VTS, 2005)