State Diagram Approach for Functional Testing of Control Section. - Chi-Chang Liaw; Stephen Y. H. Su; Yashwant K. Malaiya (ITC, 1981)

Test-Experiments for Detection and Location of Intermittent Faults in Sequential Circuits. - Chi-Chang Liaw; Stephen Y. H. Su; Yashwant K. Malaiya (IEEE Trans. Computers, 1981)

A high level synthesis tool for MOS chip design. - Jean-Pierre Dussault; Chi-Chang Liaw; Michael M. Tong (DAC, 1984)