Platinum growth analysis in atomic layer deposition using in-situ resistance measurement. - Wen-Hao Cho; Chi-Chung Kei; Bo-Heng Liu; Yo-Shane Yu; Fong-Zhi Chen (I2MTC, 2016)

Corrosion and mechanical properties of atomic layer deposited TiO2 coatings on NiTi implants. - Chi-Chung Kei; Yu-Hsuan Yu; Jan Racek; David Vokoun; Lukas Kaderavek (ICIT, 2016)

Aggressively Scaled Atomic Layer Deposited Amorphous InZnOx Thin Film Transistor Exhibiting Prominent Short Channel Characteristics (SS= 69 mV/dec.; DIBL = 27.8 mV/V) and High Gm(802 μS/μm at VDS = 2V). - Yan-Kui Liang; June-Yang Zheng; Yu-Lon Lin; Wei-Li Li; Yu-Cheng Lu; Dong-Ru Hsieh; Li-Chi Peng; Tsung-Te Chou; Chi-Chung Kei; Chun-Chieh Lu; Huai-Ying Huang; Yuan-Chieh Tseng; et al. (VLSI Technology and Circuits, 2023)

On the Extreme Scaling of Transistors with Monolayer MOS2 Channel. - Wen-Chia Wu; Terry Y. T. Hung; D. Mahaveer Sathaiya; Edward Chen; Chen-Feng Hsu; Walker Yun; Hsiang-Chi Hu; Bo-Heng Liu; T. Y. Lee; Chi-Chung Kei; Wen-Hao Chang; Jin Cai; et al. (VLSI Technology and Circuits, 2024)

Eco-friendly, High-Resolution Fluorescence Diamond-Based Broadband EUV and X-Ray Beam Profiler System. - Yu-Hsin Yang; Ya-Ting Kang; Tzu-Ping Huang; Yin-Yu Lee; Yu-Chan Lin; Pei-Jie Wu; Guo-Hao Lu; Chun-Jen Weng; Chi-Hung Hwang; Wen-Tse Hsiao; Chi-Chung Kei; Wen-Hao Cho; et al. (I2MTC, 2025)