A Retention-Error Mitigation Method on TLC NAND Flash Memory for CE Storage Systems. - Chin-Hsien Wu; Yi-Lun Lan; Wei-Hao Wu; Chi-Yen Yang (ICCE-TW, 2021)

A Dynamic Huffman Coding Method for Reliable TLC NAND Flash Memory. - Chin-Hsien Wu; Hao-Wei Zhang; Chia-Wei Liu; Ta-Ching Yu; Chi-Yen Yang (ACM Trans. Design Autom. Electr. Syst., 2021)

A low-complexity coding method for mitigating retention errors and read-disturb errors in TLC NAND flash memory. - Chin-Hsien Wu; Chi-Yen Yang (RACS, 2022)