Layer-Aware Program-and-Read Schemes for 3D Stackable Vertical-Gate BE-SONOS NAND Flash Against Cross-Layer Process Variations. - Chun-Hsiung Hung; Meng-Fan Chang; Yih-Shan Yang; Yao-Jen Kuo; Tzu-Neng Lai; Shin-Jang Shen; Jo-Yu Hsu; Shuo-Nan Hung; Hang-Ting Lue; Yen-Hao Shih; Shih-Lin Huang; Ti-Wen Chen; et al. (IEEE J. Solid State Circuits, 2015)