An embedded processor based SOC test platform. - Kuen-Jong Lee; Chia-Yi Chu; Yu-Ting Hong (ISCAS (3), 2005)

The ESD protection characteristic and low-frequency noise analysis of GaN Schottky barrier diode with fluorine-based plasma treatment. - Hsien-Chin Chiu; Ji-Fan Chi; Hsuan-Ling Kao; Chia-Yi Chu; Kuan-Liang Cho; Feng-Tso Chien (Microelectron. Reliab., 2016)