A neural network weight determination model designed uniquely for small data set learning. - Der-Chiang Li; Chiao-Wen Liu (Expert Syst. Appl., 2009)

A learning method for the class imbalance problem with medical data sets. - Der-Chiang Li; Chiao-Wen Liu; Susan C. Hu (Comput. Biol. Medicine, 2010)

A class possibility based kernel to increase classification accuracy for small data sets using support vector machines. - Der-Chiang Li; Chiao-Wen Liu (Expert Syst. Appl., 2010)

A fuzzy-based data transformation for feature extraction to increase classification performance with small medical data sets. - Der-Chiang Li; Chiao-Wen Liu; Susan C. Hu (Artif. Intell. Medicine, 2011)

Recursive operation time maximization model for the maintenance of power generation equipment. - Der-Chiang Li; Chiao-Wen Liu; Tung-Liang Chen (Comput. Oper. Res., 2012)

Using structure-based data transformation method to improve prediction accuracies for small data sets. - Der-Chiang Li; Chih-Chieh Chang; Chiao-Wen Liu (Decis. Support Syst., 2012)

Determining manufacturing parameters to suppress system variance using linear and non-linear models. - Der-Chiang Li; Wen-Chih Chen; Chiao-Wen Liu; Che-Jung Chang; Chien-Chih Chen (Expert Syst. Appl., 2012)

A non-linear quality improvement model using SVR for manufacturing TFT-LCDs. - Der-Chiang Li; Wen-Chih Chen; Chiao-Wen Liu; Yao-San Lin (J. Intell. Manuf., 2012)

Using past manufacturing experience to assist building the yield forecast model for new manufacturing processes. - Der-Chiang Li; Yao-Hwei Fang; Chiao-Wen Liu; Cheng-jung Juang (J. Intell. Manuf., 2012)

Extending Attribute Information for Small Data Set Classification. - Der-Chiang Li; Chiao-Wen Liu (IEEE Trans. Knowl. Data Eng., 2012)

An intelligent system for wafer bin map defect diagnosis: An empirical study for semiconductor manufacturing. - Chiao-Wen Liu; Chen-Fu Chien 001 (Eng. Appl. Artif. Intell., 2013)

A new approach for manufacturing forecast problems with insufficient data: the case of TFT-LCDs. - Der-Chiang Li; Chih-Chieh Chang; Chiao-Wen Liu; Wen-Chih Chen (J. Intell. Manuf., 2013)

Analysing semiconductor manufacturing big data for root cause detection of excursion for yield enhancement. - Chen-Fu Chien 001; Chiao-Wen Liu; Shih-Chung Chuang (Int. J. Prod. Res., 2017)

Applications of fractal-type kernels in Gaussian process regression and support vector machine regression. - Dah-Chin Luor; Chiao-Wen Liu (Comput. Appl. Math., 2024)