Characterization of self-heating effects in semiconductor resistors during transmission line pulses. - Chiara Corvasce; Mauro Ciappa; Davide Barlini; S. Sponton; Gaudenzio Meneghesso; Wolfgang Fichtner (Microelectron. Reliab., 2004)

The impact on power semiconductor device operation due to local electric field alterations in the planar junction termination. - Munaf Rahimo; Frank Richter; Fabian Fischer 002; Umamaheswara Vemulapati; Arnost Kopta; Chiara Corvasce; Silvan Geissmann; Marco Bellini; Martin J. Bayer; Friedhelm Bauer (Microelectron. Reliab., 2016)

Extraction of dynamic avalanche during IGBT turn off. - Silvan Geissmann; L. De Michielis; Chiara Corvasce; Munaf Rahimo; M. Andenna (Microelectron. Reliab., 2017)

The influence of humidity on the high voltage blocking reliability of power IGBT modules and means of protection. - Charalampos Papadopoulos; Chiara Corvasce; Arnost Kopta; Daniel Schneider; Gontran Pâques; Munaf Rahimo (Microelectron. Reliab., 2018)