Defect Detection on Wafer Map Using Efficient Convolutional Neural Network. - Chieng-Yang Wang; Tsung-Han Tsai 001 (ICCE-TW, 2021)

Joint Masked Face Recognition and Temperature Measurement System Using Convolutional Neural Networks. - Tsung-Han Tsai 001; Ji-Xiu Lu; Xuan-Yu Chou; Chieng-Yang Wang (Sensors, 2023)

Wafer map defect classification using deep learning framework with data augmentation on imbalance datasets. - Tsung-Han Tsai 001; Chieng-Yang Wang (EURASIP J. Image Video Process., 2025)