Constructing Control Process for Wafer Defects Using Data Mining Technique. - Leeing Tong; Hsingyin Lee; Chifeng Huang; Changke Lin; Chienhui Yang (ICEB, 2004)

Reliable confidence intervals for assessing normal process incapability. - Mou-Yuan Liao; Chien-Hua Lin; Chien-Wei Wu; Chienhui Yang (Commun. Stat. Simul. Comput., 2017)