Optimal Step-Stress Accelerated Degradation Test Plan for Gamma Degradation Processes. - Sheng-Tsaing Tseng; Narayanaswamy Balakrishnan 001; Chih-Chun Tsai (IEEE Trans. Reliab., 2009)

Optimal Burn-In Policy for Highly Reliable Products Using Gamma Degradation Process. - Chih-Chun Tsai; Sheng-Tsaing Tseng; Narayanaswamy Balakrishnan 001 (IEEE Trans. Reliab., 2011)

Optimal Design for Degradation Tests Based on Gamma Processes With Random Effects. - Chih-Chun Tsai; Sheng-Tsaing Tseng; Narayanaswamy Balakrishnan 001 (IEEE Trans. Reliab., 2012)

Lifetime Inference for Highly Reliable Products Based on Skew-Normal Accelerated Destructive Degradation Test Model. - Chih-Chun Tsai; Chien-Tai Lin (IEEE Trans. Reliab., 2015)

Optimal Design for Accelerated-Stress Acceptance Test Based on Wiener Process. - Chih-Chun Tsai; Chien-Tai Lin; Narayanaswamy Balakrishnan 001 (IEEE Trans. Reliab., 2015)

Lamination Scheme of Curing Degree at Multiple Levels of Temperature With Location-Scale Regression. - Chih-Chun Tsai; Chien-Tai Lin; Narayanaswamy Balakrishnan 001 (IEEE Access, 2021)

Optimal confidence interval for the largest exponential location parameter. - Shun-Yi Chen; Chih-Chun Tsai; Hubert J. Chen; Su-Hao Lee (Commun. Stat. Simul. Comput., 2022)