Phase-shift imaging ellipsometer for measuring thin-film thickness. - Chih-Jen Yu; Ching-Hung Hung; Kuei-Chu Hsu; Chien Chou (Microelectron. Reliab., 2015)

Effects of Annealing Temperature on Morphology and LSPR Sensing Performance of Au Nanostructures. - Chih-Ching Ho; Chih-Jen Yu; Chia-Ming Yang (IEEE SENSORS, 2024)