Statistical Analysis of the Random Telegraph Noise in a 1.1 μm Pixel, 8.3 MP CMOS Image Sensor Using On-Chip Time Constant Extraction Method. - Calvin Yi-Ping Chao; Honyih Tu; Thomas Meng-Hsiu Wu; Kuo-Yu Chou; Shang-Fu Yeh; Chin Yin; Chih-Lin Lee (Sensors, 2017)

Random Telegraph Noises from the Source Follower, the Photodiode Dark Current, and the Gate-Induced Sense Node Leakage in CMOS Image Sensors. - Calvin Yi-Ping Chao; Shang-Fu Yeh; Meng-Hsu Wu; Kuo-Yu Chou; Honyih Tu; Chih-Lin Lee; Chin Yin; Philippe Paillet; Vincent Goiffon (Sensors, 2019)

Random Telegraph Noise Degradation Caused by Hot Carrier Injection in a 0.8 μm-Pitch 8.3Mpixel Stacked CMOS Image Sensor. - Calvin Yi-Ping Chao; Thomas Meng-Hsiu Wu; Shang-Fu Yeh; Chih-Lin Lee; Honyih Tu; Joey Chiao-Yi Huang; Chin-Hao Chang (Sensors, 2023)