Efficient diagnosis of scan chains with single stuck-at faults. - Hsin-Chou Chi; Hsi-Che Tseng; Chih-Ling Yang (CISS, 2009)

Efficient diagnosable design of the IEEE P1500 architecture for SoC testing. - Hsin-Chou Chi; Hsi-Che Tseng; Chih-Ling Yang (NESEA, 2011)