A Bayesian framework to integrate knowledge-based and data-driven inference tools for reliable yield diagnoses. - Chih-Min Fan; Yun-Pei Lu (WSC, 2008)

A Bayesian Ranking Scheme for supporting cost-effective yield diagnosis services. - Chih-Min Fan; Yun-Pei Lu (CASE, 2009)

A novel ontology-based knowledge engineering approach for yield symptom identification in semiconductor manufacturing. - Fang-Hsiang Su; Shi-Chung Chang; Chih-Min Fan; Ya-Jung Tsai; J. Jheng; Ching-Pin Kao; Chun-Yao Lu (CASE, 2009)