Treatment of missing values for association rule-based tool commonality analysis in semiconductor manufacturing. - Rong-Huei Chen; Chih-Ming Fan (CASE, 2012)

Markov-chain based missing value estimation method for tool commonality analysis in semiconductor manufacturing. - Rong-Huei Chen; Chih-Ming Fan (WSC, 2012)

Identifying ill tool combinations via Gibbs sampler for semiconductor manufacturing yield diagnosis. - Yu-Chin Hsu; Rong-Huei Chen; Chih-Ming Fan (WSC, 2012)