A 45 nm Stacked CMOS Image Sensor Process Technology for Submicron Pixel. - Seiji Takahashi; Yi-Min Huang; Jhy-Jyi Sze; Tung-Ting Wu; Fu-Sheng Guo; Wei-Cheng Hsu; Tung-Hsiung Tseng; King Liao; Chin-Chia Kuo; Tzu-Hsiang Chen; Wei-Chieh Chiang; Chun-Hao Chuang; et al. (Sensors, 2017)

A rapid household mite detection and classification technology based on artificial intelligence-enhanced scanned images. - Lydia Hsiao-Mei Lin; Wei-Cheng Lien; Cindy Yu-Ting Cheng; You-Cheng Lee; Yi-Ting Lin; Chin-Chia Kuo; Yi-Ting Lai; Yan-Tsung Peng (Internet Things, 2025)