IDDQ Test Challenges in Nanotechnologies: A Manufacturing Test Strategy. - Yu Wei P'ng; Moo Kit Lee; Peng Weng Ng; Chin Hu Ong (ATS, 2007)

Diagnosis of Voltage Dependent Scan Chain Failure Using VBUMP Scan Debug Method. - Khairul Khusyari; Wei Tee Ng; Neal Jaarsma; Robert Abraham; Peng Weng Ng; Boon Hui Ang; Chin Hu Ong (ATS, 2008)