Testing methods for a write-assist disturbance-free dual-port SRAM. - Hao-Yu Yang; Chen-Wei Lin; Chao-Ying Huang; Ching-Ho Lu; Chen-An Lai; Mango Chia-Tso Chao; Rei-Fu Huang (VTS, 2014)

Methodology of generating dual-cell-aware tests. - Yu-Hao Huang; Ching-Ho Lu; Tse-Wei Wu; Yu-Teng Nien; Ying-Yen Chen; Max Wu; Jih-Nung Lee; Mango C.-T. Chao (VTS, 2017)