Precise and flexible modeling for semiconductor wafer fabrication. - Shinji Nakamura; Chisato Hashimoto; Osamu Mori (WSC, 1993)

Observation of the internal waveforms in high-speed high-density LSIs using an EOS prober. - Chisato Hashimoto; Takamitsu Takizawa; Sigeru Nakajima; Mitsuru Shinagawa; Tadao Nagatsuma (Microelectron. Reliab., 2001)