Very Low Voltage Operational Amplifiers Using Floating Gate MOS Transistor. - Chong-Gun Yu; Randall L. Geiger (ISCAS, 1993)

An Accurate and Matching-Free Threshold Voltage Extraction Scheme for MOS Transistors. - Chong-Gun Yu; Randall L. Geiger (ISCAS, 1994)

An automatic offset compensation scheme with ping-pong control for CMOS operational amplifiers. - Chong-Gun Yu; Randall L. Geiger (IEEE J. Solid State Circuits, 1994)

Increased hot carrier effects in Gate-All-Around SOI nMOSFET's. - Jong Tae Park 003; Nag Jong Choi; Chong-Gun Yu; Seok Hee Jeon; Jean-Pierre Colinge (Microelectron. Reliab., 2003)

Reduced Hot Carrier Effects in Self-Aligned Ground-Plane FDSOI MOSFET's. - Se Re Na Yun; Chong-Gun Yu; Seok Hee Jeon; Chungkyue Kim; Jong Tae Park 003; Jean-Pierre Colinge (Microelectron. Reliab., 2004)

New experimental findings on hot-carrier-induced degradation in lateral DMOS transistors. - In Kyung Lee; Se Re Na Yun; Kyosun Kim; Chong-Gun Yu; Jong Tae Park 003 (Microelectron. Reliab., 2006)

Comparative study of NBTI as a function of Si film orientation and thickness in SOI pMOSFETs. - Sung Jun Jang; Dae Hyun Ka; Chong-Gun Yu; Kwan-Su Kim; Won-Ju Cho; Jong Tae Park 003 (Microelectron. Reliab., 2007)

NBTI and hot carrier effect of SOI p-MOSFETs fabricated in strained Si SOI wafer. - Yong Woo Jeon; Dae Hyun Ka; Chong-Gun Yu; Won-Ju Cho; M. Saif Islam; Jong Tae Park 003 (Microelectron. Reliab., 2009)

Effects of device layout on the drain breakdown voltages in MuGFETs. - Jin-Young Kim; Chong-Gun Yu; Jong Tae Park 003 (Microelectron. Reliab., 2011)

Drain breakdown voltage: A comparison between junctionless and inversion mode p-channel MOSFETs. - Seung-Min Lee; Chong-Gun Yu; Seung Min Jeong; Won-Ju Cho; Jong Tae Park 003 (Microelectron. Reliab., 2012)

A comparative study on device degradation under a positive gate stress and hot carrier stress in InGaZnO thin film transistors. - Hyun Jun Jang; Seung Min Lee; Chong-Gun Yu; Jong Tae Park 003 (Microelectron. Reliab., 2013)

Hot carrier and PBTI induced degradation in silicon nanowire gate-all-around SONOS MOSFETs. - Jin Hyung Choi; Jin-Woo Han; Chong-Gun Yu; Jong Tae Park 003 (Microelectron. Reliab., 2014)

Effect of source and drain asymmetry on hot carrier degradation in vertical nanowire MOSFETs. - Jae Hoon Lee; Jin-Woo Han; Chong-Gun Yu; Jong Tae Park 003 (Microelectron. Reliab., 2015)

Nanowire width dependence of data retention and endurance characteristics in nanowire SONOS flash memory. - Jin Hyung Choi; Chong-Gun Yu; Jong Tae Park 003 (Microelectron. Reliab., 2016)

Impact of work function of the silicon bottom-gates on electrical instability in InGaZnO thin film transistors. - Hyun Jun Jang; Chong-Gun Yu; Jong Tae Park 003 (Microelectron. Reliab., 2016)

Thermal energy harvesting circuit with maximum power point tracking control for self-powered sensor node applications. - Eun-Jung Yoon; Jong-Tae Park 003; Chong-Gun Yu (Frontiers Inf. Technol. Electron. Eng., 2018)