Analysis and Design of ESD Protection Circuits for High-Frequency/RF Applications. - Choshu Ito; Kaustav Banerjee; Robert W. Dutton (ISQED, 2001)

Post-breakdown leakage resistance and its dependence on device area. - Tze Wee Chen; Choshu Ito; William Loh; Robert W. Dutton (Microelectron. Reliab., 2006)

RF ESD protection strategies: Codesign vs. low-C protection. - Wolfgang Soldner; Martin Streibl; U. Hodel; Marc Tiebout; Harald Gossner; Doris Schmitt-Landsiedel; Jung-Hoon Chun; Choshu Ito; Robert W. Dutton (Microelectron. Reliab., 2007)