Polysilicon resistor stability under voltage stress for safe-operating area characterization. - Chris Kendrick; Michael Cook 004; Jeff P. Gambino; T. Myers; J. Slezak; T. Hirano; T. Sano; Y. Watanabe; K. Ozeki (IRPS, 2018)

Studies of Bias Temperature Instabilities in 4H-SiC DMOSFETs. - Amartya Ghosh; Jifa Hao; Michael Cook 004; Chris Kendrick; Samia A. Suliman; Gavin D. R. Hall; Tom Kopley; Osama O. Awadelkarim (IRPS, 2020)

Dielectric Relaxation, Aging and Recovery in High-K MIM Capacitors. - Konner E. K. Holden; Gavin D. R. Hall; Michael Cook 004; Chris Kendrick; Kaitlyn Pabst; Bruce Greenwood; Robin Daugherty; Jeff P. Gambino; Derryl D. J. Allman (IRPS, 2021)

Repetitive Pulse Testing for LDMOS Transistor Reliability. - Tianjiao Liu; Michael Cook 004; Chris Kendrick (IRPS, 2024)