Enhancing Diagnosis through AI-driven Analysis of Reflectance Confocal Microscopy. - Hong-Jun Yoon; Chris Keum; Alexander Witkowski; Joanna Ludzik; Tracy Petrie; Heidi A. Hanson; Sancy A. Leachman (CoRR, 2024)

High-Throughput Phenotyping using Computer Vision and Machine Learning. - Vivaan Singhvi; Langalibalele Lunga; Pragya Nidhi; Chris Keum; Varrun Prakash (CoRR, 2024)