Systematic Hold-time Fault Diagnosis and Failure Debug in Production Chips. - Chih-Yan Liu; Mu-Ting Wu; James Chien-Mo Li; Gaurav Bhargava; Chris Nigh (ATS, 2020)

Test Pattern Superposition to Detect Hardware Trojans. - Chris Nigh; Alex Orailoglu (DATE, 2020)

Taming Combinational Trojan Detection Challenges with Self-Referencing Adaptive Test Patterns. - Chris Nigh; Alex Orailoglu (VTS, 2020)

AAA: Automated, On-ATE AI Debug of Scan Chain Failures. - Chris Nigh; Gaurav Bhargava; Ronald D. Blanton (ITC, 2021)

Improving Volume Diagnosis and Debug with Test Failure Clustering and Reorganization. - Mu-Ting Wu; Cheng-Sian Kuo; James Chien-Mo Li; Chris Nigh; Gaurav Bhargava (ITC, 2021)

AdaTrust: Combinational Hardware Trojan Detection Through Adaptive Test Pattern Construction. - Chris Nigh; Alex Orailoglu (IEEE Trans. Very Large Scale Integr. Syst., 2021)

Diagnosing Double Faulty Chains through Failing Bit Separation. - Cheng-Sian Kuo; Bing-Han Hsieh; James Chien-Mo Li; Chris Nigh; Gaurav Bhargava; Mason Chern (ITC, 2022)

PEPR: Pseudo-Exhaustive Physically-Aware Region Testing. - Wei Li; Chris Nigh; Danielle Duvalsaint; Subhasish Mitra; Ronald D. Blanton (ITC, 2022)

Diagnosis of Systematic Delay Failures Through Subset Relationship Analysis. - Bing-Han Hsieh; Yun-Sheng Liu; James Chien-Mo Li; Chris Nigh; Mason Chern; Gaurav Bhargava (ITC, 2023)

Silent Data Corruption: Test or Reliability Problem? - Erik Jan Marinissen; Harish Dattatraya Dixit; Ronald Shawn Blanton; Aaron Kuo; Wei Li; Subhasish Mitra; Chris Nigh; Ruben Purdy; Ben Kaczer; Dishant Sangani; Pieter Weckx; Philippe J. Roussel; et al. (ETS, 2024)

Faulty Function Extraction for Defective Circuits. - Chris Nigh; Ruben Purdy; Wei Li; Subhasish Mitra; R. D. Shawn Blanton (ETS, 2024)

Logic-AAA: Debug of Logic Failures with an on-ATE Expert System. - Chris Nigh; Ronald D. Blanton (VTS, 2024)

CHEF: CHaracterizing Elusive Logic Circuit Failures. - Ruben Purdy; Chris Nigh; Wei Li; R. D. Shawn Blanton (VTS, 2025)