Screening MinVDD Outliers Using Feed-Forward Voltage Testing. - Robert Madge; B. H. Goh; V. Rajagopalan; C. Macchietto; W. Robert Daasch; Chris Schuermyer; C. Taylor; David Turner (ITC, 2002)

Impact of Multiple-Detect Test Patterns on Product Quality. - Brady Benware; Chris Schuermyer; Sreenevasan Ranganathan; Robert Madge; Prabhu Krishnamurthy; Nagesh Tamarapalli; Kun-Han Tsai; Janusz Rajski (ITC, 2003)

Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ. - Chris Schuermyer; Brady Benware; Kevin Cota; Robert Madge; W. Robert Daasch; L. Ning (ITC, 2003)

In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost. - Robert Madge; Brady Benware; Ritesh P. Turakhia; W. Robert Daasch; Chris Schuermyer; Jens Ruffler (ITC, 2004)

Minimum Testing Requirements to Screen Temperature Dependent Defects. - Chris Schuermyer; Jens Ruffler; W. Robert Daasch (ITC, 2004)

Achieving higher yield through diagnosis-the ASIC perspective. - Chris Schuermyer (ITC, 2005)

Identification of systematic yield limiters in complex ASICS through volume structural test fail data visualization and analysis. - Chris Schuermyer; Kevin Cota; Robert Madge; Brady Benware (ITC, 2005)

A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis. - Martin Keim; Nagesh Tamarapalli; Huaxing Tang; Manish Sharma; Janusz Rajski; Chris Schuermyer; Brady Benware (ITC, 2006)

Extracting Defect Density and Size Distributions from Product ICs. - Jeffrey E. Nelson; Thomas Zanon; Jason G. Brown; Osei Poku; R. D. (Shawn) Blanton; Wojciech Maly; Brady Benware; Chris Schuermyer (IEEE Des. Test Comput., 2006)

Silicon Evaluation of Static Alternative Fault Models. - Chris Schuermyer; Jewel Pangilinan; Jay Jahangiri; Martin Keim; Janusz Rajski; Brady Benware (VTS, 2007)

Determination of Dominant-Yield-Loss Mechanism with Volume Diagnosis. - Manish Sharma; Chris Schuermyer; Brady Benware (IEEE Des. Test Comput., 2010)

A Hybrid Flow for Memory Failure Bitmap Classification. - Jianbo Li; Yu Huang 005; Wu-Tung Cheng; Chris Schuermyer; Dong Xiang; Eric Faehn; Ruth Farrugia (Asian Test Symposium, 2012)

Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results. - Brady Benware; Chris Schuermyer; Manish Sharma; Thomas Herrmann (IEEE Des. Test Comput., 2012)

Deriving Feature Fail Rate from Silicon Volume Diagnostics Data. - Shobhit Malik; Thomas Herrmann; Sriram Madhavan; Rao Desineni; Chris Schuermyer; Geir Eide (IEEE Des. Test, 2013)