Noncontact wafer probe using wireless probe cards. - Chris Sellathamby; Md. Mahbub Reja; Lin Fu; Brenda Bai; Edwin Walter Reid; Steven Slupsky; Igor M. Filanovsky; Kris Iniewski (ITC, 2005)

A New CMOS 3.1-11.7 GHz Low Power LNA for Ultra-Wideband Wireless Applications. - Md. Mahbub Reja; Chris Sellathamby; Igor M. Filanovsky (ISCAS, 2007)

High throughput non-contact SiP testing. - Brian Moore 001; Chris Sellathamby; Philippe Cauvet; Hérvé Fleury; M. Paulson; Md. Mahbub Reja; Lin Fu; Brenda Bai; Edwin Walter Reid; Igor M. Filanovsky; Steven Slupsky (ITC, 2007)

Chip to chip communications for terabit transmission rates. - Brian Moore 001; Chris Sellathamby; Steven Slupsky; Kris Iniewski (APCCAS, 2008)

Non-contact Testing for SoC and RCP (SIPs) at Advanced Nodes. - Brian Moore 001; Marc Mangrum; Chris Sellathamby; Md. Mahbub Reja; T. Weng; Brenda Bai; Edwin Walter Reid; Igor M. Filanovsky; Steven Slupsky (ITC, 2008)

Contactless testing: Possibility or pipe-dream? - Erik Jan Marinissen; Dae Young Lee; John P. Hayes; Chris Sellathamby; Brian Moore 001; Steven Slupsky; Laurence Pujol (DATE, 2009)