Tester Memory Requirements and Test Application Time Reduction for Delay Faults with Digital Captureless Test Sensors. - Claude Thibeault; Yassine Hariri; Christelle Hobeika (J. Electron. Test., 2012)

Technical report: Functional Constraint Extraction From Register Transfer Level for ATPG. - Christelle Hobeika; Claude Thibeault; Jean-François Boland (CoRR, 2013)

A Library-Based Early Soft Error Sensitivity Analysis Technique for SRAM-Based FPGA Design. - Claude Thibeault; Yassine Hariri; Syed Rafay Hasan; Christelle Hobeika; Yvon Savaria; Yves Audet; Fatima Zahra Tazi (J. Electron. Test., 2013)

Multi-abstraction level signature generation and comparison based on radiation single event upset. - Christelle Hobeika; Simon Pichette; M. A. Leonard; Claude Thibeault; Jean-François Boland; Yves Audet (IOLTS, 2014)

Functional Constraint Extraction From Register Transfer Level for ATPG. - Christelle Hobeika; Claude Thibeault; Jean-François Boland (IEEE Trans. Very Large Scale Integr. Syst., 2015)

Design of a tolerant flight control system in response to multiple actuator control signal faults induced by cosmic rays. - Azeddine Ghodbane; Maarouf Saad; Christelle Hobeika; Jean-François Boland; Claude Thibeault (IEEE Trans. Aerosp. Electron. Syst., 2016)