Improving Ge-rich GST ePCM reliability through BEOL engineering. - Andrea Redaelli; Anna Gandolfo; Giulia Samanni; Enrico Gomiero; Elisa Petroni; Luca Scotti; Andrea Lippiello; Paolo Mattavelli; J. Jasse; D. Codegoni; A. Serafini; Rossella Ranica; et al. (ESSDERC, 2021)

An 18nm ePCM with BJT selector NVM design for advanced microcontroller applications. - Antonino Conte; Francesco Tomaiuolo; Marco Ruta; Andrea Redaelli; Franck Arnaud; Thomas Jouanneau; Christian Boccaccio; Olivier Weber (IMW, 2023)