Scanning probe microscopy in semiconductor failure analysis. - Bernd Ebersberger; Alexander Olbrich; Christian Boit (Microelectron. Reliab., 2001)

Application of Scanning Probe Microscopy techniques in Semiconductor Failure Analysis. - Bernd Ebersberger; Alexander Olbrich; Christian Boit (Microelectron. Reliab., 2001)

Localization of FET Device Performance with Thermal Laser Stimulation. - Sanjib Kumar Brahma; Christian Boit; Arkadiusz Glowacki; Hiroyoshi Suzuki (Microelectron. Reliab., 2004)

Seebeck Effect Detection on Biased Device without OBIRCH Distortion Using FET Readout. - Sanjib Kumar Brahma; Christian Boit; Arkadiusz Glowacki (Microelectron. Reliab., 2005)

Electrical Performance Evaluation of FIB Edited Circuits through Chip Backside Exposing Shallow Trench Isolations. - Rudolf Schlangen; Uwe Kerst; A. Kabakow; Christian Boit (Microelectron. Reliab., 2005)

Contact to contacts or silicide by use of backside FIB circuit edit allowing to approach every active circuit node. - Rudolf Schlangen; Peter Sadewater; Uwe Kerst; Christian Boit (Microelectron. Reliab., 2006)

Backside E-Beam Probing on Nano scale devices. - Rudolf Schlangen; Reiner Leihkauf; Uwe Kerst; Christian Boit; Rajesh Jain; Tahir Malik; Keneth R. Wilsher; Ted R. Lundquist; Bernd Krüger (ITC, 2007)

Non destructive 3D chip inspection with nano scale potential by use of backside FIB and backscattered electron microscopy. - Rudolf Schlangen; Uwe Kerst; Christian Boit; Tahir Malik; Rajesh Jain; Ted R. Lundquist (Microelectron. Reliab., 2007)

Physical Techniques for Chip-Backside IC Debug in Nanotechnologies. - Christian Boit; Rudolf Schlangen; Uwe Kerst; Ted R. Lundquist (IEEE Des. Test Comput., 2008)

Comparison of laser voltage probing and mapping results in oversized and minimum size devices of 120 nm and 65 nm technology. - Ulrike Kindereit; Christian Boit; Uwe Kerst; Steven Kasapi; Radu Ispasoiu; Roy Ng; William K. Lo (Microelectron. Reliab., 2008)

Timing analysis of scan design integrated circuits using stimulation by an infrared diode laser in externally triggered pulsing condition. - Tuba Kiyan; Christof Brillert; Christian Boit (Microelectron. Reliab., 2008)

Detectability of dynamic photon emission in static Si CCD for signal path determination in integrated circuits. - Piotr Laskowski; Arkadiusz Glowacki; Christian Boit (Microelectron. Reliab., 2008)

Characterization of stress degradation effects and thermal properties of AlGaN/GaN HEMTs with photon emission spectral signatures. - Arkadiusz Glowacki; Piotr Laskowski; Christian Boit; Ponky Ivo; Eldad Bahat-Treidel; Reza Pazirandeh; Richard Lossy; Joachim Würfl; Günther Tränkle (Microelectron. Reliab., 2009)

Physical analysis, trimming and editing of nanoscale IC function with backside FIB processing. - Rudolf Schlangen; Reiner Leihkauf; Uwe Kerst; Ted R. Lundquist; Peter Egger; Christian Boit (Microelectron. Reliab., 2009)

Extraction of local thin-film solar cell parameters by bias-dependent IR-LBIC. - Mahyar Boostandoost; Uwe Kerst; Christian Boit (Microelectron. Reliab., 2010)

Optimizing focused ion beam created solid immersion lenses in bulk silicon using design of experiments. - Philipp Scholz; Christian Gallrapp; Uwe Kerst; Ted R. Lundquist; Christian Boit (Microelectron. Reliab., 2010)

Laser induced impact ionization effect in MOSFET during 1064 nm laser stimulation. - Sanjib Kumar Brahma; Arkadiusz Glowacki; Reiner Leihkauf; Christian Boit (Microelectron. Reliab., 2011)

Performance improvement of Si-CCD detector based backside reflected light and photon emission microscopy by FIB ultimate substrate thinning. - Arkadiusz Glowacki; Christian Boit; Philippe Perdu (Microelectron. Reliab., 2011)

Comparative study of AlGaN/GaN HEMTs robustness versus buffer design variations by applying Electroluminescence and electrical measurements. - Ponky Ivo; Arkadiusz Glowacki; Eldad Bahat-Treidel; Richard Lossy; Joachim Würfl; Christian Boit; Günther Tränkle (Microelectron. Reliab., 2011)

On charge sensors for FIB attack detection. - Clemens Helfmeier; Christian Boit; Uwe Kerst (HOST, 2012)

Optimum Si thickness for backside detection of photon emission using Si-CCD. - Arkadiusz Glowacki; Christian Boit; Philippe Perdu (Microelectron. Reliab., 2012)

Comparison of FET electro-optical modulation for 1300 nm and 1064 nm laser sources. - Carlo Pagano; Christian Boit; Arkadiusz Glowacki; Reiner Leihkauf; Yoshiyuki Yokoyama (Microelectron. Reliab., 2012)

Feasibly clonable functions. - Christian Boit; Clemens Helfmeier; Dmitry Nedospasov (TrustED@CCS, 2013)

Breaking and entering through the silicon. - Clemens Helfmeier; Dmitry Nedospasov; Christopher Tarnovsky; Jan Starbug Krissler; Christian Boit; Jean-Pierre Seifert (CCS, 2013)

Security Risks Posed by Modern IC Debug and Diagnosis Tools. - Christian Boit; Clemens Helfmeier; Uwe Kerst (FDTC, 2013)

Invasive PUF Analysis. - Dmitry Nedospasov; Jean-Pierre Seifert; Clemens Helfmeier; Christian Boit (FDTC, 2013)

Cloning Physically Unclonable Functions. - Clemens Helfmeier; Christian Boit; Dmitry Nedospasov; Jean-Pierre Seifert (HOST, 2013)

Physical vulnerabilities of Physically Unclonable Functions. - Clemens Helfmeier; Christian Boit; Dmitry Nedospasov; Shahin Tajik; Jean-Pierre Seifert (DATE, 2014)

Emission Analysis of Hardware Implementations. - Shahin Tajik; Dmitry Nedospasov; Clemens Helfmeier; Jean-Pierre Seifert; Christian Boit (DSD, 2014)

Physical Characterization of Arbiter PUFs. - Shahin Tajik; Enrico Dietz; Sven Frohmann; Jean-Pierre Seifert; Dmitry Nedospasov; Clemens Helfmeier; Christian Boit; Helmar Dittrich (IACR Cryptol. ePrint Arch., 2014)

Editorial. - Christian Boit (Microelectron. Reliab., 2014)

Backside spectroscopic photon emission microscopy using intensified silicon CCD. - Arkadiusz Glowacki; Christian Boit; Philippe Perdu; Yoshitaka Iwaki (Microelectron. Reliab., 2014)

Focused ion beam contact to non-volatile memory cells. - Clemens Helfmeier; Rudolf Schlangen; Christian Boit (Microelectron. Reliab., 2014)

New degradation mechanism observed for AlGaN/GaN HEMTs with sub 100 nm scale unpassivated regions around the gate periphery. - Ponky Ivo; Eunjung Melanie Cho; Przemyslaw Kotara; Lars Schellhase; Richard Lossy; Ute Zeimer; Anna Mogilatenko; Joachim Würfl; Günther Tränkle; Arkadiusz Glowacki; Christian Boit (Microelectron. Reliab., 2014)

Efficient and flexible Focused Ion Beam micromachining of Solid Immersion Lenses in various bulk semiconductor materials - An adaptive calibration algorithm. - Philipp Scholz; Norbert Herfurth; Michael Sadowski; Ted R. Lundquist; Uwe Kerst; Christian Boit (Microelectron. Reliab., 2014)

Laser Fault Attack on Physically Unclonable Functions. - Shahin Tajik; Heiko Lohrke; Fatemeh Ganji; Jean-Pierre Seifert; Christian Boit (FDTC, 2015)

A Complete and Linear Physical Characterization Methodology for the Arbiter PUF Family. - Shahin Tajik; Enrico Dietz; Sven Frohmann; Helmar Dittrich; Dmitry Nedospasov; Clemens Helfmeier; Jean-Pierre Seifert; Christian Boit; Heinz-Wilhelm Hübers (IACR Cryptol. ePrint Arch., 2015)

Ultra sensitive measurement of dielectric current under pulsed stress conditions. - Clemens Helfmeier; Anne Beyreuther; Alexander Fox; Christian Boit (Microelectron. Reliab., 2015)

No Place to Hide: Contactless Probing of Secret Data on FPGAs. - Heiko Lohrke; Shahin Tajik; Christian Boit; Jean-Pierre Seifert (IACR Cryptol. ePrint Arch., 2016)

PUFMon: Security monitoring of FPGAs using physically unclonable functions. - Shahin Tajik; Julian Fietkau 002; Heiko Lohrke; Jean-Pierre Seifert; Christian Boit (IOLTS, 2017)

On the Power of Optical Contactless Probing: Attacking Bitstream Encryption of FPGAs. - Shahin Tajik; Heiko Lohrke; Jean-Pierre Seifert; Christian Boit (IACR Cryptol. ePrint Arch., 2017)

Photonic Side-Channel Analysis of Arbiter PUFs. - Shahin Tajik; Enrico Dietz; Sven Frohmann; Helmar Dittrich; Dmitry Nedospasov; Clemens Helfmeier; Jean-Pierre Seifert; Christian Boit; Heinz-Wilhelm Hübers (J. Cryptol., 2017)

Technologies for Heterogeneous Integration - Challenges and chances for fault isolation. - Christian Boit (Microelectron. Reliab., 2017)

Optical interaction in active analog circuit elements. - Ivo Vogt; Tomonori Nakamura; Christian Boit (Microelectron. Reliab., 2017)

Assessment of a Chip Backside Protection. - Elham Amini; Anne Beyreuther; Norbert Herfurth; Alexander Steigert; Bernd Szyszka; Christian Boit (J. Hardw. Syst. Secur., 2018)

IC security and quality improvement by protection of chip backside against hardware attacks. - Elham Amini; Anne Beyreuther; Norbert Herfurth; Alexander Steigert; R. Muydinov; Bernd Szyszka; Christian Boit (Microelectron. Reliab., 2018)

Photon emission as a characterization tool for bipolar parasitics in FinFET technology. - Anne Beyreuther; Norbert Herfurth; Elham Amini; Tomonori Nakamura; Ingrid De Wolf; Christian Boit (Microelectron. Reliab., 2018)

Device characterization of 16/14 nm FinFETs for reliability assessment with infrared emission spectra. - Ivo Vogt; Tomonori Nakamura; B. Motamedi; Christian Boit (Microelectron. Reliab., 2018)

Detection of failure mechanisms in 24-40 nm FinFETs with (spectral) photon emission techniques using InGaAs camera. - Ivo Vogt; Tomonori Nakamura; Ingrid De Wolf; Christian Boit (Microelectron. Reliab., 2018)

Key Extraction Using Thermal Laser Stimulation A Case Study on Xilinx Ultrascale FPGAs. - Heiko Lohrke; Shahin Tajik; Thilo Krachenfels; Christian Boit; Jean-Pierre Seifert (IACR Trans. Cryptogr. Hardw. Embed. Syst., 2018)

New Access to Soft Breakdown Parameters of Low-k Dielectrics Through Localisation-Based Analysis. - Norbert Herfurth; Anne Beyreuther; Elham Amini; Christian Boit; Michél Simon-Najasek; Susanne Hübner; Frank Altmann; R. Herfurth; Chen Wu; Ingrid De Wolf; Kris Croes (IRPS, 2019)

Nano Security: From Nano-Electronics to Secure Systems. - Ilia Polian; Frank Altmann; Tolga Arul; Christian Boit; Ralf Brederlow; Lucas Davi; Rolf Drechsler; Nan Du 004; Thomas Eisenbarth 001; Tim Güneysu; Sascha Hermann; Matthias Hiller; et al. (DATE, 2021)

Special Session: Physical Attacks through the Chip Backside: Threats, Challenges, and Opportunities. - Elham Amini; Kai Bartels; Christian Boit; Marius Eggert; Norbert Herfurth; Tuba Kiyan; Thilo Krachenfels; Jean-Pierre Seifert; Shahin Tajik (VTS, 2021)