Failure analyses for debug and ramp-up of modern IC's. - Christian Burmer; Siegfried Görlich (Microelectron. Reliab., 2006)

ATPG scan logic failure analysis: a case study of logic ICs - fault isolation, defect mechanism identification and yield improvement. - Liming Gao; Christian Burmer; Frank Siegelin (Microelectron. Reliab., 2006)

Application of time resolved emission techniques within the failure analysis flow. - Peter Egger; Markus Grützner; Christian Burmer; Fabien Dudkiewicz (Microelectron. Reliab., 2007)

PLL soft functional failure analysis in advanced logic product using fault based analogue simulation and soft defect localization. - Liming Gao; Christian Burmer (Microelectron. Reliab., 2008)

Ultra-fast CAD scan chain highlighting for failure analysis assistance. - Markus Grützner; Christian Burmer; Christof Brillert (Microelectron. Reliab., 2010)

Managing Complex Failure Analysis Workflows with LLM-based Reasoning and Acting Agents. - Aline Dobrovsky; Konstantin Schekotihin; Christian Burmer (CoRR, 2025)