Total Deep Variation for Noisy Exit Wave Reconstruction in Transmission Electron Microscopy. - Thomas Pinetz; Erich Kobler; Christian Doberstein; Benjamin Berkels; Alexander Effland (SSVM, 2021)

Lattice Multislice Algorithm for Fast Simulation of Scanning Transmission Electron Microscopy Images. - Christian Doberstein; Peter Binev (CoRR, 2023)