EDMOS in ultrathin FDSOI: Effect of doping and layout of the drift region. - Antoine Litty; Sylvie Ortolland; Dominique Golanski; Christian Dutto; Sorin Cristoloveanu (ESSDERC, 2015)

Circuit Monitoring Across Design Life-Cycle in 28nm FD-SOI and 40nm Bulk CMOS technologies. - Sylvain Clerc; Kedar Janardan Dhori; Robin M. Wilson; Rohit Goel; Sébastien Marchal; Franck Pourchon; Christian Dutto; Ricardo Gomez Gomez (ESSCIRC, 2021)