The Design of Large Real-Time Systems: The Time-Triggered Approach. - Hermann Kopetz; Martin Braun; Christian Ebner; Andreas Krüger; Dietmar Millinger; Roman Nossal; Anton V. Schedl (RTSS, 1995)

Efficiency evaluation of a time-triggered architecture for vehicle body-electronics. - Christian Ebner (ECRTS, 1998)

A 10-GB/s SONET-compliant CMOS transceiver with low crosstalk and intrinsic jitter. - Heinz Werker; Stephan Mechnig; Christophe Holuigue; Christian Ebner; Gerhard Mitteregger; Ernesto Romani; Frédéric Roger; Thomas Blon; Michael Moyal; Marcello Vena; Andrea Melodia; John Fisher; et al. (IEEE J. Solid State Circuits, 2004)

A 14b 20mW 640MHz CMOS CT ΔΣ ADC with 20MHz Signal Bandwidth and 12b ENOB. - Gerhard Mitteregger; Christian Ebner; Stephan Mechnig; Thomas Blon; Christophe Holuigue; E. Romani; Andrea Melodia; V. Melini (ISSCC, 2006)

A 20-mW 640-MHz CMOS Continuous-Time $ Sigma Delta$ ADC With 20-MHz Signal Bandwidth, 80-dB Dynamic Range and 12-bit ENOB. - Gerhard Mitteregger; Christian Ebner; Stephan Mechnig; Thomas Blon; Christophe Holuigue; Ernesto Romani (IEEE J. Solid State Circuits, 2006)

Mixing non-Newtonian flows in anaerobic digesters by impellers and pumped recirculation. - Michael Meister; Massoud Rezavand; Christian Ebner; Thomas Pümpel; Wolfgang Rauch (Adv. Eng. Softw., 2018)

Model-Based Dependability Analysis of Fail-Operational Electric Drivetrains. - Christian Ebner; Kirill Gorelik; Armin Zimmermann (AIM, 2020)

Optimization of Fail-Operational Vehicle Traction Battery System Design. - Christian Ebner; Kirill Gorelik; Armin Zimmermann (ISSE, 2020)

Automated Dynamic Safety Evaluation of Generic Fail-Operational Mechatronic Systems. - Christian Ebner; Kirill Gorelik; Armin Zimmermann (ICPHM, 2021)

Model-Based Design Space Exploration for Fail-Operational Mechatronic Systems. - Christian Ebner; Kirill Gorelik; Armin Zimmermann (ISSE, 2021)

Automated Design Exploration and Dynamic Safety Analysis for Optimization of Mechatronic Systems in Safety-Critical Automotive Applications. - Christian Ebner; Kirill Gorelik; Armin Zimmermann (IEEE Syst. J., 2023)