A new method for on-line state machine observation for embedded microprocessors. - Matthias Pflanz; Christian Galke; Heinrich Theodor Vierhaus (HLDVT, 2000)

A Test Processor Concept for Systems-on-a-Chip. - Christian Galke; Matthias Pflanz; Heinrich Theodor Vierhaus (ICCD, 2002)

On-line Detection and Compensation of Transient Errors in Processor Pipeline-Structures. - Christian Galke; Matthias Pflanz; Heinrich Theodor Vierhaus (IOLTW, 2002)

On-Line Error Detection and Correction in Storage Elements with Cross-Parity Check. - Matthias Pflanz; Karsten Walther; Christian Galke; Heinrich Theodor Vierhaus (IOLTW, 2002)

Perspectives of Combining on-line and off-line Test Technology for Dependable Systems on a Chip. - Christian Galke; Marcus Grabow; Heinrich Theodor Vierhaus (IOLTS, 2003)

On-Line Techniques for Error Detection and Correction in Processor Registers with Cross-Parity Check. - Matthias Pflanz; Karsten Walther; Christian Galke; Heinrich Theodor Vierhaus (J. Electron. Test., 2003)

A Hierarchical Self Test Scheme for SoCs. - Claudia Kretzschmar; Christian Galke; Heinrich Theodor Vierhaus (IOLTS, 2004)

A Multi-Purpose Concept for SoC Self Test Including Diagnostic Features. - René Kothe; Christian Galke; Heinrich Theodor Vierhaus (IOLTS, 2005)

Logic Self Repair. - Christian Galke; René Kothe; Heinrich Theodor Vierhaus (ARCS Workshops, 2006)

Hardware/Software Based Hierarchical Self Test for SoCs. - René Kothe; Christian Galke; Sabine Schultke; Henry Fröschke; Steffen Gaede; Heinrich Theodor Vierhaus (DDECS, 2006)

Scan-Based SoC Test Using Space / Time Pattern Compaction Schemes. - Christian Galke; U. Gätzschmann; Heinrich Theodor Vierhaus (DSD, 2006)

Embedded Scan Test with Diagnostic Features for Self-Testing SoCs. - Christian Galke; René Kothe; Sabine Schultke; K. Winkler; Jeanette Honko; Heinrich Theodor Vierhaus (IOLTS, 2006)

A Configurable Modular Test Processor and Scan Controller Architecture. - R. Frost; D. Rudolph; Christian Galke; René Kothe; Heinrich Theodor Vierhaus (IOLTS, 2007)