A design for robust wide metal tracks. - Markus Ackermann 002; Verena Hein; Christian Kovács; Kirsten Weide-Zaage (Microelectron. Reliab., 2012)

Degradation behavior in upstream/downstream via test structures. - Jörg Kludt; Kirsten Weide-Zaage; Markus Ackermann 002; Verena Hein; Christian Kovács (Microelectron. Reliab., 2014)