Control of the electromagnetic compatibility: An issue for IC reliability. - Jean-Baptiste Gros; Geneviève Duchamp; Jean-Luc Levant; Christian Marot (Microelectron. Reliab., 2011)

Using the EM simulation tools to predict the Conducted Emissions level of a DC/DC boost converter: Introducing EBEM-CE model. - André Durier; Christian Marot; Olivier Crépel (EMC Compo, 2013)

Developing a universal exchange format for Integrated Circuit Emission Model - Conducted Emissions. - Abhishek Ramanujan; Etienne Sicard; Alexandre Boyer; Jean-Luc Levant; Christian Marot; Frédéric Lafon (EMC Compo, 2015)