Robust design of thermo-mechanical MEMS switch embedded in aluminium BEOL interconnect. - Sebastian Orellana; Brice Arrazat; Pascal Fornara; Christian Rivero; Sylvain Blayac; Pierre Montmitonnet; Karim Inal (Microelectron. Reliab., 2015)

AC stress reliability study of a new high voltage transistor for logic memory circuits. - Jordan Locati; Vincenzo Della Marca; Christian Rivero; Arnaud Régnier; Stephan Niel; Karine Coulié (IRPS, 2020)