Similarities and Differences of BTI in SiC and Si Power MOSFETs. - Judith Berens; Magdalena Weger; Gregor Pobegen; Thomas Aichinger; Gerald Rescher; Christian Schleich; Tibor Grasser (IRPS, 2020)

Generation of Hot-Carrier Induced Border and Interface Traps, Investigated by Spectroscopic Charge Pumping. - Bernhard Ruch; Gregor Pobegen; Christian Schleich; Tibor Grasser (IRPS, 2020)

TCAD for Circuits and Systems: Process Emulation, Parasitics Extraction, Self-Heating. - Zlatan Stanojevic; Xaver Klemenschits; Gerhard Rzepa; Ferdinand Mitterbauer; Christian Schleich; Franz Schanovsky; Oskar Baumgartner; Markus Karner (BCICTS, 2024)