Timing analysis of scan design integrated circuits using stimulation by an infrared diode laser in externally triggered pulsing condition. - Tuba Kiyan; Christof Brillert; Christian Boit (Microelectron. Reliab., 2008)

Ultra-fast CAD scan chain highlighting for failure analysis assistance. - Markus Grützner; Christian Burmer; Christof Brillert (Microelectron. Reliab., 2010)