Christoforos G. Theodorou

Orcid: 0000-0001-5120-2233

Affiliations:
  • Grenoble INP, France
  • Grenoble Alpes University, IMEP-LAHC, France


According to our database1, Christoforos G. Theodorou authored at least 15 papers between 2009 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

2023
Experimental Study of Self-Heating Effect in InGaAs HEMTs for Quantum Technologies Down to 10K.
Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022
Accounting for Current Degradation Effects in the Compact Noise Modeling of Nano-scale MOSFETs.
Proceedings of the 11th International Conference on Modern Circuits and Systems Technologies, 2022

In-depth electrical characterization of deca-nanometer InGaAs MOSFET down to cryogenic temperatures for low-power quantum applications.
Proceedings of the 52nd IEEE European Solid-State Device Research Conference, 2022

2021
Inter-tier Coupling Analysis in Back-illuminated Monolithic 3DSI Image Sensor Pixels.
Proceedings of the 10th International Conference on Modern Circuits and Systems Technologies, 2021

"Pinch to Detect": A Method to Increase the Number of Detectable RTN Traps in Nano-scale MOSFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2021

VERILOR: A Verilog-A Model of Lorentzian Spectra for Simulating Trap-related Noise in CMOS Circuits.
Proceedings of the 51st IEEE European Solid-State Device Research Conference, 2021

2018
1/f Noise Characterization of Piezoresistive Nano-Gauges for MEMS Sensors.
Proceedings of the 2018 IEEE SENSORS, New Delhi, India, October 28-31, 2018, 2018

Static and Low Frequency Noise Characterization of InGaAs MOSFETs and FinFETs on Insulator.
Proceedings of the 48th European Solid-State Device Research Conference, 2018

2016
Hot carrier degradation modeling of short-channel n-FinFETs suitable for circuit simulators.
Microelectron. Reliab., 2016

Noise-induced dynamic variability in nano-scale CMOS SRAM cells.
Proceedings of the 46th European Solid-State Device Research Conference, 2016

Statistical characterization of drain current local and global variability in sub 15nm Si/SiGe Trigate pMOSFETs.
Proceedings of the 46th European Solid-State Device Research Conference, 2016

2015
New LFN and RTN analysis methodology in 28 and 14nm FD-SOI MOSFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2015

2014
Statistical analysis of dynamic variability in 28nm FD-SOI MOSFETs.
Proceedings of the 44th European Solid State Device Research Conference, 2014

2012
Impact of front-back gate coupling on low frequency noise in 28 nm FDSOI MOSFETs.
Proceedings of the 2012 European Solid-State Device Research Conference, 2012

2009
A new linear voltage-to-current converter with threshold voltage compensation for analog circuits applications in polycrystalline silicon TFT process.
Proceedings of the 16th IEEE International Conference on Electronics, 2009


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